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	<title>Comments on: On The Challenges of Thermal Characterization of High-Power, High-Brightness LED Packages</title>
	<atom:link href="http://www.electronics-cooling.com/2008/05/on-the-challenges-of-thermal-characterization-of-high-power-high-brightness-led-packages/feed/" rel="self" type="application/rss+xml" />
	<link>http://www.electronics-cooling.com/2008/05/on-the-challenges-of-thermal-characterization-of-high-power-high-brightness-led-packages/</link>
	<description>Dedicated to Thermal Management in the Electronics Industry</description>
	<lastBuildDate>Tue, 31 Jan 2012 20:43:24 +0000</lastBuildDate>
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		<title>By: Jim Corzoni</title>
		<link>http://www.electronics-cooling.com/2008/05/on-the-challenges-of-thermal-characterization-of-high-power-high-brightness-led-packages/comment-page-1/#comment-6480</link>
		<dc:creator>Jim Corzoni</dc:creator>
		<pubDate>Tue, 31 Jan 2012 20:43:24 +0000</pubDate>
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		<description>Although this paper provides some useful insight to die measurement techniques, It would be better that you give the thermal resistances of the external elements like the heatsink, bonding method... etc.  I am trying to figure out the thermal resistance of the die to the die&#039;s mounting surface to see the limits on packaging.</description>
		<content:encoded><![CDATA[<p>Although this paper provides some useful insight to die measurement techniques, It would be better that you give the thermal resistances of the external elements like the heatsink, bonding method&#8230; etc.  I am trying to figure out the thermal resistance of the die to the die&#8217;s mounting surface to see the limits on packaging.</p>
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