Cooling Options And Challenges Of High Power Semiconductor Modules
Scott G. Leslie, Powerex, Inc.
Introduction Trends in power electronics systems and devices over the last decade have placed increasing demands on the efficiencies of the thermal management systems used for power Metal
Oxide Semiconductor Field-Effect Transistor (MOSFET) and Insulated Gate Bipolar Transistor (IGBT) modules. The pressure to decrease the size of power electronics systems and, subsequently, the module,
has resulted in a 50% footprint area reduction of some IGBT modules. This has resulted in higher power dissipation densities for the IGBT die as well as the module due to denser packing of the die.
Increases in switching frequencies and voltage ratings of IGBTs also result in higher power dissipation at the die level. Even though a portion of the die power losses has been offset by advances in both
MOSFET and IGBT chip design, the cooling capabilities of present modules limit the device performance.
Power modules used in Hybrid Electric Vehicles (HEV) provide an additional challenge in that the inlet temperature of the coolant
can be over 100°C, requiring low temperature differentials (20 - 30°C) between the die and the coolant to keep the IGBT comfortably below the maximum operating temperature of 150°C, while
simultaneously dissipating high heat fluxes. In other HEV designs, less efficient liquids, namely oil or transmission fluid, may be the only coolants available for cooling the power module.
Faced with the challenges of efficiently and economically cooling increasing power dissipation densities with low temperature
differentials, power semiconductor module designers are turning to new heat sink technologies. In this article, several methods for reducing the thermal resistance of power modules are presented and
compared in the context of a baseline 1200V isolated base IGBT power module design.
Comparison of Techniques for Reducing Thermal Resistance Most conventional power modules have been designed to be cooled by bolting the module to an external heatsink or cold plate cooled
by forced air or circulated liquid. As shown in Figure 1, the critical layers in the thermal path of a conventional IGBT module are the IGBT die, the die attach solder, a metal-clad ceramic substrate
(copper directly bonded on alumina or aluminum nitride), substrate attach solder, metal or composite baseplate, thermal interface material (TIM), and the external heatsink. The insulator provides
electrical isolation between the die and the module baseplate. Aluminum nitride (AlN) is preferred over alumina (Al2O3) because of its higher thermal conductivity. With the many
layers in the heat flow path, this configuration is not capable of adequately cooling devices with power dissipation densities beyond 250 - 300 W/cm².
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Details of the five concepts are listed in Table 1. Two of the five heatsink types (Type 3 and Type 4) were fabricated with
silicon die bonded to AlN substrates 0.635 mm thick, with 0.305 mm thick direct-bonded copper (DBC) layers commonly used in 1200V IGBT modules, so the published data was used as is. The other three types
of heatsinks required adjustments to the reported data to obtain the overall junction to liquid thermal resistivity of the baseline IGBT module design. For example, if the thermal performance results
reported in the literature included only the cold plate, the calculated thermal resistivity of the IGBT die, DBC AlN, and appropriate solder layers were added to determine the overall thermal resistivity
from junction to inlet water. A simple one-dimensional heat flow calculation without spreading was used to calculate the thermal resistance:
Thermal Resistance = Layer Thickness
Thermal Conductivity x Area
An area of 1 cm²
was used to obtain the thermal resistivity to facilitate comparison of the five concepts. It should be noted at this point that the values of thermal resistivity obtained using this simple model tend to be lower than actual measured values, which will likely show the performance of Types 1, 2 and 5 as somewhat better than can actually be obtained.
The Type 1 and Type 5 concepts are "pin fin" designs, which utilize turbulent liquid flow around staggered rows of pins to enhance
heat transfer to the liquid. Both concepts utilize coolant flow parallel to the heat generation surface. The Type 1 pin fin design consists of copper pins brazed directly to the bottom DBC layer of the
AlN insulator. The pin fin AlN substrate is brazed to a copper baseplate, which is then bolted to a block that serves as the water inlet/outlet manifolds and flow channel [1]. The flow channel was
designed to minimize water flow outside of the pin array. This cold plate was fabricated using 1.0 mm thick AlN, so the measured junction to water thermal resistivity was reduced by a calculated factor
of 0.0215°C-cm²/W (the difference between the AlN thickness of 1.0 and 0.635 mm) to permit direct comparison with the other concepts. The Type 5 design is a stand-alone Aluminum Silicon Carbide
(AlSiC) cold plate with molded pins of AlSiC [2]. For comparison to the other designs, a calculated thermal resistivity of 0.149°C-cm²/W for was added to the reported values to simulate the layers
from the die to the top surface of the coldplate. The layer thicknesses and values of thermal conductivity used are listed in Table 2.
Table 2. Layer Properties Used to Calculate Thermal Resistivities in Heatsink Comparison.
The Type 3 concept utilizes microchannels with coolant flow parallel to the heat removal
surface [3,4]. This design employs the process for direct bonding of copper to AlN to laminate up to 11 thin copper layers with etched holes between two AlN substrates. The holes in each layer
are offset to provide a serpentine path for the coolant, maximizing surface area and ensuring turbulent flow. The IGBT chip is soldered to the top AlN substrate, permitting this design to be
integrated directly in the module package.
The Type 2 configuration is a commercially available, normal flow, microchannel heatsink
(NFMCH) and is a stand-alone copper cold plate with multiple, densely packed micro-streams of coolant impinging on the heat acquistion surface at right angles [5]. As in the case of the Type 5
cold plate, a thermal resistivity of 0.149°C-cm²/W was added to the reported values to simulate the layers from the die to the top surface of the coldplate.
The Type 4 concept is a NFMCH heatsink that utilizes microchannels machined in the
bottom DBC copper layer of the AlN substrate coupled with a manifold that delivers coolant flow normal to the DBC layer [6]. Since the reported results were from an actual 1200V IGBT module
[7], no adjustments were necessary. In this concept, as is the case with the Type 1 and Type 3 designs, the coolant is brought as close to the die as practical.
The power module designer must balance several tradeoffs when selecting a thermal
management method, namely thermal resistivity, required flow rate, pressure drop, type of coolant, size, weight, reliability, and cost. The first three performance parameters will be compared in this
article. Comparing different heatsinks on the basis of absolute flow rates can be misleading since they are invariably different sizes and shapes, and have varying heat generation and cooling
surface areas. These differences can be seen in Table 1 for the five types considered here.
A more valid comparison is to normalize the absolute flow rate of each heatsink to the
total cooling surface area. The area normalized flow rate is especially relevant for normal flow heatsinks since the inlet water streams to the cooling surface are basically in parallel. The thermal
resistivity (junction - water) for the 1200V IGBT baseline module designed with each heatsink concept is plotted as a function of water flow rate per total cooling area in Figure 2. Since the
same unit volume of water is used to cool the entire heat removal surface area, the parallel flow heatsinks require lower flow rates. However, the increase in coolant temperature along the length
of the water flow path can lead to temperature non-uniformities within the power module.
 Figure 2. Comparison of thermal resistivities from junction to water of 1200V IGBT power modules fabricated
with the five types of heatsink designs vs. water flow rate normalized to the total heatsink surface cooling area.
Finally, the thermal resistivity as a function of pressure drop of each heat sink type is
plotted in Figure 3. Due to their short flow passages compared to parallel flow designs, normal flow heatsinks exhibit lower pressure drops. The pressure drop in parallel flow heatsinks is partially
dependent on the channel length to width aspect ratio. One means of decreasing the pressure drop and improving the temperature uniformity of parallel flow designs is to decrease the aspect ratio.
The lower the aspect ratio becomes, the more the parallel flow design resembles the normal flow design with the subsequent increase in required flow rates.
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Figure 3. Comparison of thermal resistivities from junction to water of 1200V IGBT power modules fabricated
with the five types of heatsink designs vs. water pressure drop.
Conclusions Several methods for improving the thermal performance of high-power semiconductor modules have been presented and compared. The baseline design of a 1200V IGBT module with an
electrically isolated base was used as a basis for comparison. Removing layers in the heat flow path led to the lowest thermal resistivities. As would be expected, the normal flow heatsinks had
lower pressure drops than the parallel flow concepts due to the short flow passages.
Scott Leslie Chief Technologist Powerex, Inc. 173 Pavilion Lane Youngwood,PA15697 Tel: 724-925-4482 Fax: 724-925-4468 Email: sleslie@pwrx.com
References
- Litvinov, A., Powerex, Inc. Private Communication, July 2006.
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Packaging Technologies, Vol. 24, June 2001, pp. 213 - 219.
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Conference and Exhibition on Power Conversion and Intelligent Motion, PCIM'98, Nurenberg, Germany, 26-28 May 1998, Curamik/Electrovac Website, www.electrovac.com (publications page).
- Schulz-Harder, J., "Efficient Cooling of Power Electronics," Proceedings of the Power Conversion and Intelligent Motion Conference - China (PCIM - China), Shanghai, China, 2006.
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- Solovitz, S., Stevanovic, L., and Beaupre, R., "Microchannel Thermal Management of High Power Devices," Proceedings of the Applied Power Electronics Conference (APEC),Dallas, Texas, 2006.
- Stevanovic, L., Solovitz, S., and Beaupre, R., "Advanced Power Module with Integrated Microchannel Cooling," Proceedings of the Electric Machines Technology Symposium,
Philadelphia, Pennsylvania, 2006.
- Mikros Datasheet, Normal Flow Cold Plate NCP-A-10-20, Mikros Website, www.mikrostechnologies.com.
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