Author Archive for Mihai G. Burzo

Numerical Simulation of Complex Submicron Devices

May 1st, 2009

Introduction Significant increases in temperature are believed to contribute to losses in reliability and performance, and can present serious complications to thermal management. The net thermal effect depends on a combination of factors related to…read more

Thermo-Reflectance Thermography For Submicron Temperature Measurements

February 1st, 2008

The primary approach to maintaining the aggressive progress in the microelectronics industry has been to increase the density of elementary transistors and to reduce the size of their active areas. As a result, the removal…read more