Peter E. Raad Southern Methodist University and TMX Scientific, Inc., Dallas, Texas A recent news item [1] described the intended efforts of researchers from IBM, EPFL, and ETH to “keep Moore’s Law for another 15…read more
Numerical Simulation of Complex Submicron Devices
May 1st, 2009
Introduction Significant increases in temperature are believed to contribute to losses in reliability and performance, and can present serious complications to thermal management. The net thermal effect depends on a combination of factors related to…read more
Thermo-Reflectance Thermography For Submicron Temperature Measurements
February 1st, 2008
The primary approach to maintaining the aggressive progress in the microelectronics industry has been to increase the density of elementary transistors and to reduce the size of their active areas. As a result, the removal…read more

