Semiconductor

Numerical Simulation of Complex Submicron Devices

May 1st, 2009

Introduction Significant increases in temperature are believed to contribute to losses in reliability and performance, and can present serious complications to thermal management. The net thermal effect depends on a combination of factors related to…read more

When Moore Is Less: Exploring the 3rd Dimension in IC Packaging

February 1st, 2009

Introduction As consumers of electronics we have become spoiled. We not only expect our electronic devices to get smaller, faster, more functional, cheaper, more interconnected, and more reliable, we actually demand it. It would not…read more

Power Map Calculations Using Image Sources and Superposition

November 1st, 2008

Introduction In the past, thermal engineers were content to calculate a single junction temperature in the thermal characterization of an integrated circuit chip in a package. In recent years, as power levels have increased, more…read more

Thermal Modeling Approaches Of GaAs Semiconductors

February 1st, 2008

Introduction Predicting gallium arsenide (GaAs) semiconductor temperature is imperative since it affects the performance and reliability of the chip and the design as a whole. In many circumstances, the thermal engineer will be asked to…read more

Thermo-Reflectance Thermography For Submicron Temperature Measurements

February 1st, 2008

The primary approach to maintaining the aggressive progress in the microelectronics industry has been to increase the density of elementary transistors and to reduce the size of their active areas. As a result, the removal…read more

A Practical Implementation Of Silicon Microchannel Coolers

November 1st, 2007

Introduction More than twenty-five years ago, Tuckerman and Pease first described the use of silicon microchannel cooling for very high power densities [1]. However, the coolers could not be fabricated easily and pressure drops were…read more

Cooling Options And Challenges Of High Power Semiconductor Modules

November 1st, 2006

Introduction Trends in power electronics systems and devices over the last decade have placed increasing demands on the efficiencies of the thermal management systems used for power Metal Oxide Semiconductor Field-Effect Transistor (MOSFET) and Insulated…read more

Thermal Challenges In LED Cooling

November 1st, 2006

Introduction During the last ten years, developments in LED semiconductors have led to an important change in LED applications from that of luminous indicator to that of illuminator. With LEDs now advancing into several lighting…read more

Toward A Thermal Figure Of Merit For Multi-Chip Packages

November 1st, 2006

Toward A Thermal Figure Of Merit For Multi-Chip Packages Bruce M. Guenin, Ph.D., Associate Editor Introduction Last issue’s Calculation Corner dealt with methods for predicting the temperature of each chip in a Multi-Chip Package (MCP)…read more

Exploring the Limits of Air Cooling

August 1st, 2006

Introduction Heat from electronic devices is an integral part of information processing, not a nuisance that can someday be eliminated. This is a physical principle that is independent of the device of information processing. However,…read more

Packaging Challenges For High Heat Flux Devices

August 1st, 2006

Introduction It comes as no surprise to anyone in our industry that device power levels are increasing to support customer expectations of ever greater functionality and performance. The greatest thermal challenges in computing occur in…read more

So Many Chips, So Little Time; Device Temperature Prediction in Multi-Chip Packages

August 1st, 2006

Introduction The same trend that has led to ever-higher levels of integration of computation and processing functions on a single chip is now driving the integration of several chips into the same package. The use…read more

Solid-State Microrefrigerator on a Chip

August 1st, 2006

Introduction Temperature control of microelectronic devices has become more important in recent years. Device miniaturization and higher switching speeds have increased power dissipation substantially. Limiting the maximum die temperature has resulted in an increase of…read more

Direct Die Attach Using a Room Temperature Soldering Process

May 1st, 2006

As the power and power density of IC components continue to rise [1], the need to effectively dissipate the heat to ensure long-term reliability has increased [2]. The largest contributor to the total thermal resistance…read more