In the standard thermal test environment, thermal test chips are designed to dissipate the applied power uniformly over most of the die surface. However, in many situations of practical interest, the power is dissipated over…read more
Determining the junction temperature in a semiconductor package, part IV – localized heat generation on the die
September 1st, 2000
High accuracy thermal interface resistance measurement using a transient method
September 1st, 2000
Heat dissipation of active devices has become one of the limiting factors in further miniaturization. While component manufacturers succeed in decreasing the overall thermal resistance of their packages, the thermal interface resistance to the board…read more
Low temperature electronic cooling
September 1st, 2000
The potential for low temperature enhancement of CMOS performance has been recognized for some time, going back as far as the late 1960′s and mid-1970′s. A collection of articles focusing on low temperature electronics is…read more
Natural convection modeling of heat sinks using web-based tools
September 1st, 2000
Heat transfer in electronic packages is a complex problem involving a network of resistive paths for the various laminated structures, bonding adhesives, lead frames, and attachment mechanisms, such as ball grid arrays. However, despite the…read more
The increasing importance of thermal test dies
September 1st, 2000
Thermal test dies are among the major tools used in package thermal design qualification. They are usually simple chips, containing heaters and temperature sensors. The sensors measure the temperature on the chip surface as a…read more
The thermal conductivity of fluids
September 1st, 2000
About 10-15 years ago, fluids, either directly (mainly Fluorocarbons), or indirectly (cold plates flushed with water) cooled the majority of mainframe computers. Nowadays, the expected increase in heat flux density causes a renewed interest in…read more

