In the August 2003 issue, the Technical Data column was devoted to emissivity in practical temperature measurements. But what about the emissivity value that should be entered in your numerical model? Can we use the…read more
Emissivity in Practical Numerical Modeling
November 1st, 2008
Posted in Materials, Compounds, Adhesives, Substrates, Technical Data | No Comments »
E missivity in Practical Temperature Measurements
August 1st, 2003
When making temperature measurements with infrared cameras and point detectors, we are always facing the question of the emissivity of our sample. In practice we would like to have a single number set in the…read more
Posted in Design, Materials, Compounds, Adhesives, Substrates, Technical Data, Test & Measurement | No Comments »
Microthermal imaging in the infrared
January 1st, 1997
John McDonald, Latigo Optics and Grant Albright EDO/Barnes Engineering Division Introduction Infrared imaging methods provide unequaled ease and flexibility forinvestigating micro-circuit temperatures. The researcher need only slide thecircuit under the objective lens and power it…read more
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