Researchers at the Georgia Institute of Technology have developed a new technique for measuring the adhesion strength between thin films of materials used in microelectronic devices, photovoltaic cells and MEMS using magnetic repulsion. The fixtureless…read more
Magnetic Testing Ensures Reliability of Microelectronic Devices
April 21st, 2012
Posted in Materials, Compounds, Adhesives, Substrates, News | 1 Comment »
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