A new report in the journal Nanotechnology offers findings of a nanoscale in situ investigation of ultrathin silicon oxide thermal decomposition by high temperature scanning tunneling microscopy. A surface chemical reaction—the thermal decomposition of ultrathin…read more
Hot STM Captures Thermal Decomposition in situ at the Nanoscale
May 10th, 2011
Posted in News, TIMs | No Comments »
Thermo-Reflectance Thermography For Submicron Temperature Measurements
February 1st, 2008
The primary approach to maintaining the aggressive progress in the microelectronics industry has been to increase the density of elementary transistors and to reduce the size of their active areas. As a result, the removal…read more
Posted in Design, Semiconductor, Technical Brief, Test & Measurement | No Comments »

