Linear Technology Corporation’s new LTC2991 is an 8-channel I²C temperature, voltage and current monitor for 3V and 5V systems. The LTC2991 is a highly integrated monitoring solution that incorporates a 14-bit ADC, 10ppm/°C voltage reference…read more
Octal Voltage, Current & Temperature Monitor Provides Remote Measurements
September 12th, 2011
Posted in New Products, Test & Measurement | No Comments »
Numerical Simulation of Complex Submicron Devices
May 1st, 2009
Introduction Significant increases in temperature are believed to contribute to losses in reliability and performance, and can present serious complications to thermal management. The net thermal effect depends on a combination of factors related to…read more
Posted in Aerospace, Applications, Automotive, Communications, Consumer, Defense, Industrial, IT Products, Medical, Power, Semiconductor, Test & Measurement | No Comments »
E missivity in Practical Temperature Measurements
August 1st, 2003
When making temperature measurements with infrared cameras and point detectors, we are always facing the question of the emissivity of our sample. In practice we would like to have a single number set in the…read more
Posted in Design, Materials, Compounds, Adhesives, Substrates, Technical Data, Test & Measurement | No Comments »
Heat transfer measurements in electronics cooling applications
September 1st, 1998
Introduction Increased performance in electronic systems along with higher packaging densities have made temperature a critical parameter. Measurements of temperature, velocity and heat transfer in electronic systems are challenging due to complex materials, configurations, and…read more
Posted in Design, Test & Measurement | No Comments »
Electrical temperature measurement using semiconductors
January 1st, 1997
Introduction Semiconductor junctions offer many useful properties including inherentcharacteristics which are well suited to temperature measurement. Within theelectronics cooling arena, these properties form the basis for “theelectrical method of junction temperature measurement” and are used…read more
Posted in Design, Semiconductor, Test & Measurement | No Comments »
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