Author Archive for Grant C. Albright

High Resolution, Real Time Micro-thermal Imaging — Steady State and Pulse Measurements on Microscopic Semiconductor Targets

February 1st, 2002

Thermal imaging of microscopic targets has evolved over the past 20 years to the point where real time “true-temperature” mapping with 50 milliKelvin sensitivity and 2.75 �m spatial resolution is possible. Recently, the capability to…read more

Posted in Design, Materials, Compounds, Adhesives, Substrates, Semiconductor, Technical Brief, Test & Measurement | No Comments »

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Microthermal imaging in the infrared

January 1st, 1997

John McDonald, Latigo Optics and Grant Albright EDO/Barnes Engineering Division Introduction Infrared imaging methods provide unequaled ease and flexibility forinvestigating micro-circuit temperatures. The researcher need only slide thecircuit under the objective lens and power it…read more

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